Gabriele Arcidiacono,  G. Marconi University, Italy

Efrén Benavides, UPM, Spain

Christopher A. Brown,  Worcester Polytechnic Institute, USA

Miguel Cavique,  Escola Naval, Portugal

Wei Chen,  Xi’an Jiaotong University, China

Paolo Citti, Marconi University, Italy

David Cochran,  IPFW, USA

Hrishikesh Deo,  Pentax Medical, USA

Sung Hee Do,   Axiomatic Design Solutions, Inc., USA

Oana Dodun,   TU of Iaşi, România

Petru Dușa,  TU of Iaşi, România

Basem El-Haik,  Six Sigma Professionals, Inc., USA

Joseph Timothy Foley,  Reykjavik University, Iceland

Alessandro Giorgetti,  G. Marconi University, Italy

António M. Gonçalves-Coelho, FCT/Universidade Nova de Lisboa, Portugal

Sang-Gook Kim,  MIT, USA

Torsten Kjellberg,  KTH, Royal Institute of Technology, Sweden

Dai Gil Lee, KAIST, Korea

Taesik Lee, KAIST, Korea

Ang Liu,  University of New South Wales, Australia

Stephen Lu,  University of Southern California, USA

Luc Mathieu, LURPA ENS Cachan, France

Dominik Matt,  University of Bolzano, Italy

James Morrison,  KAIST, Korea

António Mourão,  FCT/Universidade Nova de Lisboa, Portugal

Masayuki Nakao,  University of Tokyo, Japan

Andrew Nee, National University of Singapore

Hilario Oh,  MIT, USA

Greg B. Olson,  QuesTek Innovations LLC, USA

Soh Khim Ong,  National University of Singapore

Matt Pallaver,  Schlumberger, USA

Gyung Jin Park,  Hanyang University, Korea

Joan B. R. Pastor,  Altran, Spain

Erik Puik, HU University of Applied Sciences Utrecht, Nederland

Moshe Shpitalni, Technion, Israel

Laurențiu Slătineanu, TU of Iaşi, România

Nam P. Suh, MIT, USA

Derrick Tate, Xi’an Jiaotong-Liverpool University, China

Mary Kathryn Thompson, Danmarks Tekniske Universitet, Denmark

Mitchel Tseng,  HKUST, Hong Kong

Aurelian Vadean, Polytechnique Montréal, Canada

Tom Vaneker,  University of Twente, Nederlands

Youbai Xie,  Jiao Tong University, China

Jakob WEBER,  Daimler AG, Germany

 

To be confirmed.